Duke Pratt School of Engineering

Study Finds Next-Generation Transistor Performance Inflated in Most Lab Testing

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.
Compound Semiconductor

Has 2D transistors' performance been inflated?

The research 'Impact of Contact Gating on Scaling of Monolayer 2D Transistors Using a Symmetric Dual-Gate Structure' appeared ...
SpaceNews

Testing, Radiation Testing: Northwestern Transistors On Space Station

EVANSTON, Ill. — Transistors based on a new kind of material created by Northwestern University researchers have been lifted into outer space on the space shuttle Endeavour and attached to the outside ...
Purdue University

Purdue engineers create model for testing transistor reliability

WEST LAFAYETTE, Ind. – Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use ...
ZDNet

Testing new transistors in space

Northwestern University researchers have developed new transistors which are currently tested on the International Space Station (ISS) to see how they react to cosmic radiation. These transistors, ...
Electronic Design

Test Setup Checks Transistors’ hFEs When Tight Control Is Important

This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
Electronic Design

System-level test contends with billions of untested transistors

Why might you need semiconductor system-level test (SLT)? As Karthik Ranganathan, director for semiconductor solutions at Astronics Test Systems, points out, if you test a 22-nm, ...