EDN

Open architecture supports parallel test

As the transistor geometry shrinks, more transistors are packed on to a single chip, reducing manufacturing cost on a per-transistor basis. The result, however, is more transistors to test; hence, ...
Business Wire

Keysight’s New Parallel Parametric Test System Delivers High Throughput and Cost-Effective Wafer Test

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Business Wire

Keithley Adds Support for Non-Volatile Memory, Very Low Frequency C-V, and Increased Parallel Testing to Semiconductor Parameter Analyzer

CLEVELAND--(BUSINESS WIRE)--Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model ...
Insurancenewsnet.com

Patent Issued for Software testing in parallel threads with a record-locking database (USPTO 11860772): State Farm Mutual Automobile Insurance Company

“Some tests associated with the software application may build on one another. For instance, a first test may create a record in a database, and a second test may be designed to further access or edit ...
Insurancenewsnet.com

Patent Issued for Software testing in parallel threads with a record-locking database (USPTO 11537508): State Farm Mutual Automobile Insurance Company

“Some tests associated with the software application may build on one another. For instance, a first test may create a record in a database, and a second test may be designed to further access or edit ...