Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

Gallium nitride (GaN) is an ideal material for applications requiring high switching speeds and minimal power losses. While ...

For nearly two decades, two-dimensional (2D) semiconductors have been studied as a complement or possible successor to silicon transistors, promising smaller, faster and more energy-efficient ...

OLEDs have become a prominent technology powering displays across devices; however, there are multiple variations, each with ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...

Researchers at Peking University in China have developed the world’s smallest and most energy-efficient ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Scientists at the University of Tokyo have captured something never seen before: a frame-by-frame view of how electron spins ...

Lab architecture used to test 2D semiconductors artificially boosts performance metrics, making it harder to assess whether these materials can truly replace silicon.