When electronics meet cosmic rays, bad things can happen. Chip makers need to test what their products can withstand, and they now can at MSU.

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance.

A common lab setup can inflate 2D transistor performance by up to five times, raising questions about how future chips are ...

Lab architecture used to test 2D semiconductors artificially boosts performance metrics, making it harder to assess whether these materials can truly replace silicon.

For nearly two decades, two-dimensional (2D) semiconductors have been studied as a complement or possible successor to silicon transistors, promising smaller, faster and more energy-efficient ...

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

Nanoscale molybdenum disulfide memristors integrated onto standard CMOS chips achieve the lowest switching voltage reported ...

A team led by Peng Zhou at Fudan University has built a radio-frequency communication system from atomically thin molybdenum disulfide transistors, flown it aboard a satellite in low Earth orbit for ...

A closely watched clinical trial in Britain that screened blood for early detection of cancer did not show a reduction in diagnoses at later stages of the disease.

By applying voltage to electrically control a new "transistor" membrane, researchers at Lawrence Livermore National Laboratory (LLNL) achieved real-time tuning of ion separations—a capability ...